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Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials
von: Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp
Springer-Verlag, 2010
ISBN: 9783642024177
260 Seiten,
Download: 6812 KB
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Format: PDF
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geeignet für:
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Typ: B (paralleler Zugriff)
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Inhaltsverzeichnis |
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Lock-inThermography |
4 |
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Preface |
6 |
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Preface of the 1st edition |
8 |
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Contents |
10 |
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1 Introduction |
12 |
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2 Physical and Technical Basics |
18 |
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3 Experimental Technique |
71 |
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4 Theory |
110 |
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5 Measurement Strategies |
157 |
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6 Typical Applications |
184 |
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7 Summary and Outlook |
236 |
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References |
241 |
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A Thermal and IR Properties of Selected Materials |
251 |
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List of Symbols |
252 |
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Abbreviations |
256 |
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Index |
258 |
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